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Polytec Inc msv-400 microscope scanning vibrometer
All values are reported as the normalised piezoelectric response. a Schematic of devices used for poling optimisation and applied poling ramp. b Optimisation of d 33,eff as a function of poling field as measured from printed circular capacitor devices via the Berlincourt method. c Optimisation of d 33,eff as a function of poling time as measured from printed circular capacitor devices via laser Doppler <t>vibrometry.</t> d Optimisation of d 31,eff as a function of poling field as measured from printed cantilever devices via laser Doppler vibrometry. e Optimisation of d 31,eff as a function of poling time as measured from printed cantilever devices via laser Doppler vibrometry
Msv 400 Microscope Scanning Vibrometer, supplied by Polytec Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/msv-400 microscope scanning vibrometer/product/Polytec Inc
Average 90 stars, based on 1 article reviews
msv-400 microscope scanning vibrometer - by Bioz Stars, 2026-04
90/100 stars

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1) Product Images from "Low-temperature processing of screen-printed piezoelectric KNbO 3 with integration onto biodegradable paper substrates"

Article Title: Low-temperature processing of screen-printed piezoelectric KNbO 3 with integration onto biodegradable paper substrates

Journal: Microsystems & Nanoengineering

doi: 10.1038/s41378-023-00489-0

All values are reported as the normalised piezoelectric response. a Schematic of devices used for poling optimisation and applied poling ramp. b Optimisation of d 33,eff as a function of poling field as measured from printed circular capacitor devices via the Berlincourt method. c Optimisation of d 33,eff as a function of poling time as measured from printed circular capacitor devices via laser Doppler vibrometry. d Optimisation of d 31,eff as a function of poling field as measured from printed cantilever devices via laser Doppler vibrometry. e Optimisation of d 31,eff as a function of poling time as measured from printed cantilever devices via laser Doppler vibrometry
Figure Legend Snippet: All values are reported as the normalised piezoelectric response. a Schematic of devices used for poling optimisation and applied poling ramp. b Optimisation of d 33,eff as a function of poling field as measured from printed circular capacitor devices via the Berlincourt method. c Optimisation of d 33,eff as a function of poling time as measured from printed circular capacitor devices via laser Doppler vibrometry. d Optimisation of d 31,eff as a function of poling field as measured from printed cantilever devices via laser Doppler vibrometry. e Optimisation of d 31,eff as a function of poling time as measured from printed cantilever devices via laser Doppler vibrometry

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Polytec Inc msv-400 microscope scanning vibrometer
All values are reported as the normalised piezoelectric response. a Schematic of devices used for poling optimisation and applied poling ramp. b Optimisation of d 33,eff as a function of poling field as measured from printed circular capacitor devices via the Berlincourt method. c Optimisation of d 33,eff as a function of poling time as measured from printed circular capacitor devices via laser Doppler <t>vibrometry.</t> d Optimisation of d 31,eff as a function of poling field as measured from printed cantilever devices via laser Doppler vibrometry. e Optimisation of d 31,eff as a function of poling time as measured from printed cantilever devices via laser Doppler vibrometry
Msv 400 Microscope Scanning Vibrometer, supplied by Polytec Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/msv-400 microscope scanning vibrometer/product/Polytec Inc
Average 90 stars, based on 1 article reviews
msv-400 microscope scanning vibrometer - by Bioz Stars, 2026-04
90/100 stars
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All values are reported as the normalised piezoelectric response. a Schematic of devices used for poling optimisation and applied poling ramp. b Optimisation of d 33,eff as a function of poling field as measured from printed circular capacitor devices via the Berlincourt method. c Optimisation of d 33,eff as a function of poling time as measured from printed circular capacitor devices via laser Doppler <t>vibrometry.</t> d Optimisation of d 31,eff as a function of poling field as measured from printed cantilever devices via laser Doppler vibrometry. e Optimisation of d 31,eff as a function of poling time as measured from printed cantilever devices via laser Doppler vibrometry
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Polytec Inc microscope scanning vibrometer polytec msv-400
All values are reported as the normalised piezoelectric response. a Schematic of devices used for poling optimisation and applied poling ramp. b Optimisation of d 33,eff as a function of poling field as measured from printed circular capacitor devices via the Berlincourt method. c Optimisation of d 33,eff as a function of poling time as measured from printed circular capacitor devices via laser Doppler <t>vibrometry.</t> d Optimisation of d 31,eff as a function of poling field as measured from printed cantilever devices via laser Doppler vibrometry. e Optimisation of d 31,eff as a function of poling time as measured from printed cantilever devices via laser Doppler vibrometry
Microscope Scanning Vibrometer Polytec Msv 400, supplied by Polytec Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/microscope scanning vibrometer polytec msv-400/product/Polytec Inc
Average 90 stars, based on 1 article reviews
microscope scanning vibrometer polytec msv-400 - by Bioz Stars, 2026-04
90/100 stars
  Buy from Supplier

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All values are reported as the normalised piezoelectric response. a Schematic of devices used for poling optimisation and applied poling ramp. b Optimisation of d 33,eff as a function of poling field as measured from printed circular capacitor devices via the Berlincourt method. c Optimisation of d 33,eff as a function of poling time as measured from printed circular capacitor devices via laser Doppler vibrometry. d Optimisation of d 31,eff as a function of poling field as measured from printed cantilever devices via laser Doppler vibrometry. e Optimisation of d 31,eff as a function of poling time as measured from printed cantilever devices via laser Doppler vibrometry

Journal: Microsystems & Nanoengineering

Article Title: Low-temperature processing of screen-printed piezoelectric KNbO 3 with integration onto biodegradable paper substrates

doi: 10.1038/s41378-023-00489-0

Figure Lengend Snippet: All values are reported as the normalised piezoelectric response. a Schematic of devices used for poling optimisation and applied poling ramp. b Optimisation of d 33,eff as a function of poling field as measured from printed circular capacitor devices via the Berlincourt method. c Optimisation of d 33,eff as a function of poling time as measured from printed circular capacitor devices via laser Doppler vibrometry. d Optimisation of d 31,eff as a function of poling field as measured from printed cantilever devices via laser Doppler vibrometry. e Optimisation of d 31,eff as a function of poling time as measured from printed cantilever devices via laser Doppler vibrometry

Article Snippet: Laser Doppler vibrometry was conducted using a PolyTec MSV-400 microscope scanning vibrometer utilising a VD-06 velocity decoder.

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